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Nanosurf Easyscan 2 AFM

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Atomic force microscopy was invented in 1986 to overcome the limitations of scanning tunnelling microscopy, namely that of conductive samples. This openened up a whole new range of applications to nanoscientists, with almost any type of surface becoming accessible at the nanoscale. But what good is such freedom when it requires specialists with the most advanced skills to operate the equipment?

Functions of Nanomaterial

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